Although both devices are for detecting temperature, there is a big gap between the two. So, how should customers differentiate when they buy?
The high and low temperature impact test chamber is used to test the temperature of the test sample. It can be used in electrical and electronic components and other original devices, mainly to detect the adaptability of the product during storage, transportation and use in a temperature-changing environment.
In order to judge the performance of the product, whether it can still meet the requirements of the user, for the product design, improvement, identification and factory inspection for each manufacturer.
However, the high and low temperature test chamber lacks a sudden temperature change function compared with the high and low temperature impact test chamber, and can also be used in industries such as electric and electric, automobile and motorcycle, aerospace, ship weapons, universities, scientific research units, etc.
Test the product in the case of high and low temperature (alternating) cyclic changes, and test its performance indicators.
To be precise, the high and low temperature impact test chambers are improved on the basis of high and low temperature test chambers. The high and low temperature test chambers are only adjustable in temperature, while the high and low temperature impact test chambers can achieve rapid temperature conversion within 5 seconds.
The recovery time is no more than 5 minutes, and the continuous temperature shock process from high to low to high can be achieved in a short time.
For more details, please feel free to contact sales@lenpure.com
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